JPH0548493B2 - - Google Patents

Info

Publication number
JPH0548493B2
JPH0548493B2 JP61136692A JP13669286A JPH0548493B2 JP H0548493 B2 JPH0548493 B2 JP H0548493B2 JP 61136692 A JP61136692 A JP 61136692A JP 13669286 A JP13669286 A JP 13669286A JP H0548493 B2 JPH0548493 B2 JP H0548493B2
Authority
JP
Japan
Prior art keywords
circuit
test
signal
input
inverter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61136692A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62293356A (ja
Inventor
Sukeyuki Tofuku
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP61136692A priority Critical patent/JPS62293356A/ja
Publication of JPS62293356A publication Critical patent/JPS62293356A/ja
Publication of JPH0548493B2 publication Critical patent/JPH0548493B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
JP61136692A 1986-06-11 1986-06-11 テスト信号発生回路 Granted JPS62293356A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61136692A JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61136692A JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Publications (2)

Publication Number Publication Date
JPS62293356A JPS62293356A (ja) 1987-12-19
JPH0548493B2 true JPH0548493B2 (en]) 1993-07-21

Family

ID=15181236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61136692A Granted JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Country Status (1)

Country Link
JP (1) JPS62293356A (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6228866B2 (ja) * 2014-03-07 2017-11-08 アルプス電気株式会社 電子回路

Also Published As

Publication number Publication date
JPS62293356A (ja) 1987-12-19

Similar Documents

Publication Publication Date Title
US6646464B2 (en) Data hold circuit, a semiconductor device and a method of designing the same
KR910000738B1 (ko) 동작 테스트실행에 적합한 반도체 집적회로
US5019772A (en) Test selection techniques
EP0205258B1 (en) Semiconductor integrated circuit having a function for switching the operational modes of an internal circuit
US6094736A (en) Semiconductor integrated circuit device
US6367044B1 (en) Semiconductor integrated circuit device
JPH0548493B2 (en])
JPS5928986B2 (ja) 半導体集積回路
JPH038126B2 (en])
JPS6180068A (ja) テスト信号発生回路
JP2001228220A (ja) 半導体装置のテスト回路
JP2861001B2 (ja) 入出力回路
JPH06311022A (ja) 半導体論理回路装置
KR100480566B1 (ko) 반도체메모리장치의리던던시메모리셀테스트신호발생기
JPS6310538A (ja) テスト回路内蔵型集積回路
JP3076267B2 (ja) 半導体集積回路
KR100532391B1 (ko) 패드수를 최소화하는 테스트 모드선택회로
JP2806744B2 (ja) 半導体集積回路
JPS6095370A (ja) 集積回路装置
KR100192583B1 (ko) 출력버퍼회로
JPH01184798A (ja) 半導体記憶装置
JPS6188169A (ja) テスト信号発生回路
JPH08285924A (ja) 半導体集積回路
WO1996033495A1 (en) On-chip capacitor
JPH0561708A (ja) 半導体集積装置